The V500 DFT-focused engineering test system includes new features and options for a wider range of applications. It includes optional support for delay (ac) scan to 30 MHz; I DDQ test methodologies; ...
Researchers from China University of Petroleum (East China), in collaboration with international partners, have reported a ...
Why isolated flows negatively impact design schedule and PPA. Benefits of unified DFT, synthesis, and physical design flows. Physical implementation optimization methods for test compression and scan ...
In today’s fast growing Systems-on-Chip (SoC), incomplete or ineffective DFT support due to poor specification or loose design practices can quickly become the critical path to making market windows ...
Researchers from China University of Petroleum (East China), in collaboration with international partners, have reported a comprehensive review of ...
What if all the DFT verification on your next big chip could be completed before tape-out? This “shift-left” of DFT verification would eliminate the need for shortcuts in verification and allow for ...
SAN JOSE, Calif. — Teseda Corp., a provider of scan-based diagnostic and debug solutions in design-for-test (DFT) applications, is struggling. The company's operations have been cut to a “minimal” ...
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