The Model 104A-1 Thermo-Probe probe tests components by applying pinpoint heat accurate to within ±1°C. Used to test devices such as diodes, resistors, and transistors, the probe takes seconds to heat ...

IC test interface solution providers, which include probe cards and IC test sockets, are engaged in price negotiations with their fabless clients as demand for wireless devices falls, according to ...

Tanaka Precious Metal Technologies has developed TK-SR, a rhodium-based material for probe pins used in probe cards during semiconductor front-end testing. Save my User ID and Password Some ...

Test facilities are beginning to implement real-time maintenance, rather than scheduled maintenance, to reduce manufacturing costs and boost product yield. Adaptive cleaning of probe needles and test ...

During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...

Delicate features, uneven surfaces, and extreme density make it difficult to manage probe force and ensure reliability.

The types of devices being deployed in cars and how they differ in functionality. Why each device type requires a different test technique. Determining the best approach for the specific application.

Vijay Sontakke, who works at Intel Corporation as a design engineer, has emerged as a key contributor to the field of semiconductor testing. He has 24 years of experience in semiconductor testing. His ...

Why are test points a crucial element in developing a successful circuit? Types of test points available, and the different techniques that employ them. Electronic design has always been an endeavor ...