For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...
"Scan chains provide a window into the chip." - Yervant Zorian, CTO of Virage Logic. "It's well known that scan chains are a major source of vulnerability in embedded systems." - Srinivas Ravi, ...
Provide practical KPIs to monitor, including FA hit rate (percent of FAs that find root cause) and time to address yield ...
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